"Advances in Kelvin Probe Force Microscopy under ambient conditions"
Studying the electrical state of the surface has always been one of the most important ways for researchers to study electron migration, charge movement and even charge accumulation on the surface to assess the stability and degradation state of photovoltaics. By detecting very small electrostatic forces between a sharp metal tip and a sample surface, Kelvin probe force microscopy provides insight to surface potential mapping making it an essential tool in corrosion studies, photovoltaic research, two-dimensional materials, ferroelectrics, biological systems, and energy-related devices. Since its emergence in 1991, scientists have tried to improve the spatial resolution of surface potential mapping to study surface phenomena in greater detail and figure out the underlying mechanisms. In this seminar, a newly developed variation of the technique, called pulsed force, will be introduced. This approach improves spatial resolution to below 10 nm under ambient conditions. This technique makes it possible to observe nanoscale degradation on the surface of photovoltaic materials, mixed halide perovskite, before any visible topographical degradation occurs. The results demonstrate how improving kelvin probe force microscopy can be utilized in early detection of surface defects in solar cells and reduce the cost of maintenance and production in energy materials.